Pattern Matching with Address Errors: Rearrangement Distances

Original language	American English
Pages (from-to)	359-370
Journal	Journal of Computer and Systems Sciences International
Volume	75
Issue number	6
State	Published - 2006

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Amihood, A., Aumann, Y., Benson, G., Levy, A., Lipsky, O., Porat, E., Skiena, S., & Vishne, U. (2006). Pattern Matching with Address Errors: Rearrangement Distances. Journal of Computer and Systems Sciences International, 75(6), 359-370.

Amihood, A. ; Aumann, Y. ; Benson, G. et al. / Pattern Matching with Address Errors: Rearrangement Distances. In: Journal of Computer and Systems Sciences International. 2006 ; Vol. 75, No. 6. pp. 359-370.

@article{2f0e2dc7cc2d4fc5894792cdf470bf28,

title = "Pattern Matching with Address Errors: Rearrangement Distances",

author = "A. Amihood and Y. Aumann and G. Benson and A. Levy and O. Lipsky and E. Porat and S. Skiena and U. Vishne",

year = "2006",

language = "American English",

volume = "75",

pages = "359--370",

journal = "Journal of Computer and Systems Sciences International",

issn = "1064-2307",

publisher = "Pleiades Publishing",

number = "6",

}

Amihood, A, Aumann, Y, Benson, G, Levy, A, Lipsky, O, Porat, E, Skiena, S & Vishne, U 2006, 'Pattern Matching with Address Errors: Rearrangement Distances', Journal of Computer and Systems Sciences International, vol. 75, no. 6, pp. 359-370.

Pattern Matching with Address Errors: Rearrangement Distances. / Amihood, A.; Aumann, Y.; Benson, G. et al.
In: Journal of Computer and Systems Sciences International, Vol. 75, No. 6, 2006, p. 359-370.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Pattern Matching with Address Errors: Rearrangement Distances

AU - Amihood, A.

AU - Aumann, Y.

AU - Benson, G.

AU - Levy, A.

AU - Lipsky, O.

AU - Porat, E.

AU - Skiena, S.

AU - Vishne, U.

PY - 2006

Y1 - 2006

M3 - Article

SN - 1064-2307

VL - 75

SP - 359

EP - 370

JO - Journal of Computer and Systems Sciences International

JF - Journal of Computer and Systems Sciences International

IS - 6

ER -

Amihood A, Aumann Y, Benson G, Levy A, Lipsky O, Porat E et al. Pattern Matching with Address Errors: Rearrangement Distances. Journal of Computer and Systems Sciences International. 2006;75(6):359-370.