Origin of the irreversibility line in thin films with and without columnar defects

R. Prozorov, M. Konczykowski, B. Schmidt, Y. Yeshurun, A. Shaulov, C. Villard, G. Koren

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

Abstract

We report on measurements of the angular dependence of the irreversibility temperature (Formula presented) in (Formula presented) thin films, defined by the onset of a third-harmonic signal and measured by a miniature Hall probe. From the functional form of (Formula presented) we conclude that the origin of the irreversibility line in unirradiated films is a dynamic crossover from an unpinned to a pinned vortex liquid. In irradiated films the irreversibility temperature is determined by the trapping angle.

Original languageEnglish
Pages (from-to)15530-15536
Number of pages7
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume54
Issue number21
DOIs
StatePublished - 1996

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