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Optoelectronics of Atomic Metal-Semiconductor Interfaces in Tin-Intercalated MoS2

  • Avraham Twitto
  • , Chen Stern
  • , Michal Poplinger
  • , Ilana Perelshtein
  • , Sabyasachi Saha
  • , Akash Jain
  • , Kristie J. Koski
  • , Francis Leonard Deepak
  • , Ashwin Ramasubramaniam
  • , Doron Naveh
  • International Iberian Nanotechnology Laboratory
  • Centre d'élaboration de matériaux et d'études structurales
  • University of Massachusetts
  • University of California at Davis

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

Metal-semiconductor interfaces are ubiquitous in modern electronics. These quantum-confined interfaces allow for the formation of atomically thin polarizable metals and feature rich optical and optoelectronic phenomena, including plasmon-induced hot-electron transfer from metal to semiconductors. Here, we report on the metal-semiconductor interface formed during the intercalation of zero-valent atomic layers of tin (Sn) between layers of MoS2, a van der Waals layered material. We demonstrate that Sn interaction leads to the emergence of gap states within the MoS2band gap and to corresponding plasmonic features between 1 and 2 eV (0.6-1.2 μm). The observed stimulation of the photoconductivity, as well as the extension of the spectral response from the visible regime toward the mid-infrared suggests that hot-carrier generation and internal photoemission take place.

Original languageEnglish
Pages (from-to)17080-17086
Number of pages7
JournalACS Nano
Volume16
Issue number10
DOIs
StatePublished - 25 Oct 2022

Bibliographical note

Publisher Copyright:
© 2022 American Chemical Society. All rights reserved.

Funding

A.J. and A.R. gratefully acknowledge research funding from the U.S. National Science Foundation (NSF-BSF 1808011) and computational support from the Extreme Science and Engineering Discovery Environment (XSEDE), which is supported by National Science Foundation grant number ACI-1548562. D.N. thanks the Binational Science Foundation and U.S. National Science Foundation for jointly funding this work through grant 2017655. The authors thank Yafit Pleger for assistance with FIB and Adi Levi for technical assistance.

FundersFunder number
NSF-BSF1808011
National Science FoundationACI-1548562
United States-Israel Binational Science Foundation2017655

    Keywords

    • hot-carrier injection
    • intercalation
    • internal photoemission
    • light-matter interaction
    • metal-semiconductor interface
    • photoconductive gain
    • plasmonic enhancement

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