Optical thickness measurement of occluded samples by lens-less Fourier transform digital holography, thermal loading, and machine learning
- Subhash Utadiya
- , Vismay Trivedi
- , Atul Srivastava
- , Humberto Cabrera
- , Maria Liz Crespo
- , Gyanendra Sheoran
- , Arun Anand
- M.S. University of Baroda
- National Institute of Technology Delhi
- Indian Institute of Technology Bombay
- Abdus Salam International Centre for Theoretical Physics
- Sardar Patel University
Research output: Contribution to journal › Article › peer-review
5
Scopus
citations