Optical thickness measurement of occluded samples by lens-less Fourier transform digital holography, thermal loading, and machine learning

Subhash Utadiya, Vismay Trivedi, Atul Srivastava, Humberto Cabrera, Maria Liz Crespo, Gyanendra Sheoran, Arun Anand

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

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Keyphrases

Physics

Engineering

Material Science

Medicine and Dentistry