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Optical method and system for extended depth of focus
Z. Zalevsky
(Inventor)
Bar-Ilan University - The Alexander Kofkin Faculty of Engineering
Electro-Optics
Xceed Imaging Ltd.
Research output
:
Patent
Overview
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Keyphrases
Extended Depth of Focus
100%
Optical Methods
100%
Optical System
100%
Optical Element
100%
Imaging Lens
100%
Phase Transition
50%
One-phase
25%
Optical Properties
25%
Diffractive Optics
25%
Optical Transparency
25%
Depth of Focus
25%
Non-diffractive
25%
Transition Region
25%
Physics
Optical Properties
100%
Optical Method
100%
Engineering
Optical Element
100%