Novel beam shaping based all optical measurement method for free charge carriers dynamics in silicon

Maor Tiferet, Nadav Shabairou, Zeev Zalevsky, Moshe Sinvani

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

We demonstrate a new experimental algorithm for the diffusion length all optical measurement. This Measurement method is based on a novel Plasma Dispersion Effect based on beam shaping method that we demonstrated in the past.

Original languageEnglish
Title of host publicationFrontiers in Optics - Proceedings Frontiers in Optics / Laser Science, Part of Frontiers in Optics + Laser Science APS/DLS, FiO 2020
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)9781943580804
DOIs
StatePublished - 14 Sep 2020
Event2020 Frontiers in Optics Conference, FiO 2020 - Washington, United States
Duration: 14 Sep 202017 Sep 2020

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

Conference2020 Frontiers in Optics Conference, FiO 2020
Country/TerritoryUnited States
CityWashington
Period14/09/2017/09/20

Bibliographical note

Publisher Copyright:
© OSA 2020 © 2020 The Author(s)

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