Abstract
The resolution of every imaging system is limited either by the F-number of its optics or by the geometry of its detection array. The geometrical limitation is caused by lack of spatial sampling points as well as by the shape of every sampling pixel which generates spectral low-pass filtering. In this paper we present a novel approach to overcome the low-pass filtering caused due to the shape of the sampling pixels. The approach combines special algorithmic together with spatial mask placed in the intermediate image plane and eventually allows geometrical super resolved imaging without relation to the actual shape of the pixels.
| Original language | American English |
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| Title of host publication | SPIE Defense, Security, and Sensing. International Society for Optics and Photonics |
| Publisher | SPIE |
| State | Published - 2009 |