Abstract
The real decrement of the x-ray refractive index of beryllium was measured for the K lines of Cu, Mo, and Ag to an accuracy 0.1% with the use of a thin-wafer monolithic Laue-Laue diffractometer of a novel design. The results are in excellent agreement with theory. A full discussion of the method is given and ways of increasing its accuracy indicated.
| Original language | English |
|---|---|
| Pages (from-to) | 643-646 |
| Number of pages | 4 |
| Journal | Physical Review B |
| Volume | 30 |
| Issue number | 2 |
| DOIs | |
| State | Published - 1984 |