Non periodic spatial masking for geometrical super resolved imaging

Amikam Borkowski, Zeev Zalevsky, Bahram Javidi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The resolution of every imaging system is limited either by the F-number of its optics or by the geometry of its detection array. The geometrical limitation is caused by lack of spatial sampling points as well as by the shape of every samplingpixel which generates spectral low-pass filtering. In this paper we present a novel approach to overcome the low-pass filtering caused due to the shape of the sampling pixels. The approach combines special algorithmic together with spatial mask placed in the intermediate image plane and eventually allows geometrical super resolved imaging without relation to the actual shape of the pixels.

Original languageEnglish
Title of host publicationThree-Dimensional Imaging, Visualization, and Display 2009
DOIs
StatePublished - 2009
EventThree-Dimensional Imaging, Visualization, and Display 2009 - Orlando, FL, United States
Duration: 15 Apr 200916 Apr 2009

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7329
ISSN (Print)0277-786X

Conference

ConferenceThree-Dimensional Imaging, Visualization, and Display 2009
Country/TerritoryUnited States
CityOrlando, FL
Period15/04/0916/04/09

Keywords

  • Spatial masks
  • Super resolution

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