Abstract
During a study of grain boundaries and interfaces in Mo/CuBSe2 (CBS, B = In,Ga) polycrystalline films, multigrain aggregates were discovered in these structures if the substrate is 7059 Corning glass or Si. These aggregates were revealed by planar electron-beam-induced current (EBIC) on the CBS surface, by normal optical microscopy on the plasma-etched CBS surface, and by optical Nomarski interference contrast (NIC) microscopy when viewed through the glass substrate. This last method is applicable also to complete solar cell structures. In that case, when the Mo film is sufficiently thin, observation through the glass substrate shows the areas onto which the CdS window layer and the metal pads are deposited on CBS films. The aggregates, which are 10-100 μm in size, probably result from differences in the thermal expansion coefficients of the components of the multilayer structure. NIC microscopy seems to be a rapid, simple and nondestructive method to assess certain aspects of film quality.
| Original language | English |
|---|---|
| Pages (from-to) | 755-757 |
| Number of pages | 3 |
| Journal | Conference Record of the IEEE Photovoltaic Specialists Conference |
| Volume | 1 |
| State | Published - May 1990 |
| Externally published | Yes |
| Event | Twenty First IEEE Photovoltaic Specialists Conference - 1990 Part 2 (of 2) - Kissimimee, FL, USA Duration: 21 May 1990 → 25 May 1990 |