Nomarski contrast microscopy of CuBSe2/Mo (B = In,Ga) films

L. Margulis, A. Jakubowicz, G. Hodes, David Cahen

Research output: Contribution to journalConference articlepeer-review


During a study of grain boundaries and interfaces in Mo/CuBSe2 (CBS, B = In,Ga) polycrystalline films, multigrain aggregates were discovered in these structures if the substrate is 7059 Corning glass or Si. These aggregates were revealed by planar electron-beam-induced current (EBIC) on the CBS surface, by normal optical microscopy on the plasma-etched CBS surface, and by optical Nomarski interference contrast (NIC) microscopy when viewed through the glass substrate. This last method is applicable also to complete solar cell structures. In that case, when the Mo film is sufficiently thin, observation through the glass substrate shows the areas onto which the CdS window layer and the metal pads are deposited on CBS films. The aggregates, which are 10-100 μm in size, probably result from differences in the thermal expansion coefficients of the components of the multilayer structure. NIC microscopy seems to be a rapid, simple and nondestructive method to assess certain aspects of film quality.

Original languageEnglish
Pages (from-to)755-757
Number of pages3
JournalConference Record of the IEEE Photovoltaic Specialists Conference
StatePublished - May 1990
Externally publishedYes
EventTwenty First IEEE Photovoltaic Specialists Conference - 1990 Part 2 (of 2) - Kissimimee, FL, USA
Duration: 21 May 199025 May 1990


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