New technique for investigating noncrystalline structures: Fourier analysis of the extended x-ray-absorption fine structure

Dale E. Sayers, Edward A. Stern, Farrel W. Lytle

Research output: Contribution to journalArticlepeer-review

1238 Scopus citations

Abstract

We have applied Fourier analysis to our point-scattering theory of x-ray absorption fine structure to invert experimental data formally into a radial structure function with determinable structural parameters of distance from the absorbing atom, number of atoms, and widths of coordination shells. The technique is illustrated with a comparison of evaporated and crystalline Ge. We find that the first and second neighbors in amorphous Ge are at the crystalline distance within the accuracy of measurement (1%).

Original languageEnglish
Pages (from-to)1204-1207
Number of pages4
JournalPhysical Review Letters
Volume27
Issue number18
DOIs
StatePublished - 1971
Externally publishedYes

Bibliographical note

Funding Information:
Research supported in part by the U. S. Air Force Office of Scientific Research, Office of Aerospace Research.

Funding Information:
Presently on sabbatical leave at the Physics Department, Technion, Haifa, Israel. Research supported in part by a National Science Foundation Senior Postdoctoral Fellowship.

Funding

Research supported in part by the U. S. Air Force Office of Scientific Research, Office of Aerospace Research. Presently on sabbatical leave at the Physics Department, Technion, Haifa, Israel. Research supported in part by a National Science Foundation Senior Postdoctoral Fellowship.

FundersFunder number
Office of Aerospace Research
National Science Foundation
Air Force Office of Scientific Research

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