Abstract
A new method is presented for measuring thermal or structural disorder. The additional disorder in the first Ge-O and Ge-Ge distances in amorphous GeO2 was measured by comparison with crystalline (-quartz) GeO2, and showed no additional disorder in the Ge-O distances but deviations in the Ge-Ge distance consistent with a 6.5° variation about a Ge-O-Ge bond angle of 130°. These results rule out the proposed microcrystalline models.
| Original language | English |
|---|---|
| Pages (from-to) | 584-587 |
| Number of pages | 4 |
| Journal | Physical Review Letters |
| Volume | 35 |
| Issue number | 9 |
| DOIs | |
| State | Published - 1975 |
| Externally published | Yes |
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