New insights into the nanostructure of innovative thin film solar cells gained by positron annihilation spectroscopy

S. W.H. Eijt, W. Shi, A. Mannheim, M. Butterling, H. Schut, W. Egger, M. Dickmann, C. Hugenschmidt, B. Shakeri, R. W. Meulenberg, V. Callewaert, R. Saniz, B. Partoens, B. Barbiellini, A. Bansil, J. Melskens, M. Zeman, A. H.M. Smets, M. Kulbak, G. HodesD. Cahen, E. Brück

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Recent studies showed that positron annihilation methods can provide key insights into the nanostructure and electronic structure of thin film solar cells. In this study, positron annihilation lifetime spectroscopy (PALS) is applied to investigate CdSe quantum dot (QD) light absorbing layers, providing evidence of positron trapping at the surfaces of the QDs. This enables one to monitor their surface composition and electronic structure. Further, 2D-Angular Correlation of Annihilation Radiation (2D-ACAR) is used to investigate the nanostructure of divacancies in photovoltaic-high-quality a-Si:H films. The collected momentum distributions were converted by Fourier transformation to the direct space representation of the electron-positron autocorrelation function. The evolution of the size of the divacancies as a function of hydrogen dilution during deposition of a-Si:H thin films was examined. Finally, we present a first positron Doppler Broadening of Annihilation Radiation (DBAR) study of the emerging class of highly efficient thin film solar cells based on perovskites.

Original languageEnglish
Article number012021
JournalJournal of Physics: Conference Series
Issue number1
StatePublished - 22 Feb 2017
Externally publishedYes
Event14th International Workshop on Slow Positron Beam Techniques and Applications, SLOPOS 2016 - Matsue, Japan
Duration: 22 May 201627 May 2016

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© Published under licence by IOP Publishing Ltd.


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