New approaches to image processing based failure analysis of nano scale ULSI devices

Z. Zalevsky; Pavel Livshits; Eran Gur

New approaches to image processing based failure analysis of nano scale ULSI devices

Z. Zalevsky, Pavel Livshits, Eran Gur

Bar-Ilan University - The Alexander Kofkin Faculty of Engineering

Research output: Book/Report › Book › peer-review

Original language	American English
Publisher	William Andrew
State	Published - 2013

Cite this

TY - BOOK

T1 - New approaches to image processing based failure analysis of nano scale ULSI devices

AU - Zalevsky, Z.

AU - Livshits, Pavel

AU - Gur, Eran

PY - 2013

Y1 - 2013

UR - https://scholar.google.co.il/scholar?q=New+approaches+to+image+processing+based+failure+analysis+of+nano+scale+ULSI+devices&btnG=&hl=en&as_sdt=0%2C5

M3 - Book

BT - New approaches to image processing based failure analysis of nano scale ULSI devices

PB - William Andrew

ER -

New approaches to image processing based failure analysis of nano scale ULSI devices

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