TY - GEN
T1 - Near-threshold 40nm supply feedback C-element
AU - Schwartz, Idan
AU - Teman, Adam
AU - Dobkin, Rostislav
AU - Fish, Alexander
PY - 2011
Y1 - 2011
N2 - The growing demand for ultra low power applications has drawn interest in low voltage digital circuits, operating in the near-threshold region. Asynchronous circuits, operating with near-threshold supply voltages, are more attractive than their synchronous counterparts due to higher resilience to PVT variations. This paper presents a novel ultra-low power C-element, which is a basic building block in common asynchronous circuits. The proposed C-element is based on a Supply Feedback concept, implemented in a cross-coupled inverter latch. Utilization of this concept enables functionality under local and global variations down to 0.3V. The cell was designed using a standard low-power 40nm technology. Simulation results show a 5.8X-24X leakage reduction at 300mV as compared to a conventional Weak Feedback C-element operating at its minimal V DD. Monte Carlo simulations prove that the proposed cell remains fully functional under global and local process variations.
AB - The growing demand for ultra low power applications has drawn interest in low voltage digital circuits, operating in the near-threshold region. Asynchronous circuits, operating with near-threshold supply voltages, are more attractive than their synchronous counterparts due to higher resilience to PVT variations. This paper presents a novel ultra-low power C-element, which is a basic building block in common asynchronous circuits. The proposed C-element is based on a Supply Feedback concept, implemented in a cross-coupled inverter latch. Utilization of this concept enables functionality under local and global variations down to 0.3V. The cell was designed using a standard low-power 40nm technology. Simulation results show a 5.8X-24X leakage reduction at 300mV as compared to a conventional Weak Feedback C-element operating at its minimal V DD. Monte Carlo simulations prove that the proposed cell remains fully functional under global and local process variations.
KW - Asynchronous
KW - C-element
KW - Near-threshold
UR - https://www.scopus.com/pages/publications/84855908128
U2 - 10.1109/asqed.2011.6111705
DO - 10.1109/asqed.2011.6111705
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AN - SCOPUS:84855908128
SN - 9781457701443
T3 - Proceedings of the 3rd Asia Symposium on Quality Electronic Design, ASQED 2011
SP - 74
EP - 78
BT - Proceedings of the 3rd Asia Symposium on Quality Electronic Design, ASQED 2011
T2 - 3rd Asia Symposium on Quality Electronic Design, ASQED 2011
Y2 - 19 July 2011 through 20 July 2011
ER -