Nanoscale silicon truncated conical photodetector at subwavelength aperture for NSOM applications

Matityahu Karelits; Gilad Hirshfeld; Yaakov Mandelbaum; Avraham Chelly; Avi Karsenty

doi:10.1109/omn.2017.8051465

Nanoscale silicon truncated conical photodetector at subwavelength aperture for NSOM applications

Matityahu Karelits, Gilad Hirshfeld, Yaakov Mandelbaum, Avraham Chelly, Avi Karsenty

Bar-Ilan University - The Alexander Kofkin Faculty of Engineering

Advanced Laboratory of Electro-Optics (ALEO)

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Scopus citations

Abstract

Silicon-based photodetector sharing subwavelength aperture and shaped as a truncated conical-probe, has been electrically and optically simulated. Designed for NSOM, it may collect near-field surface information with clear advantage of a resolution inaccessible by conventional optical microscopy. Results present a promising device for several wavelengths.

Original language	English
Title of host publication	2017 International Conference on Optical MEMS and Nanophotonics, OMN 2017 - Proceedings
Publisher	IEEE Computer Society
ISBN (Electronic)	9781538607374
DOIs	https://doi.org/10.1109/omn.2017.8051465
State	Published - 26 Sep 2017
Event	22nd International Conference on Optical MEMS and Nanophotonics, OMN 2017 - Santa Fe, United States Duration: 13 Aug 2017 → 17 Aug 2017

Publication series

Name	International Conference on Optical MEMS and Nanophotonics
ISSN (Print)	2160-5033
ISSN (Electronic)	2160-5041

Conference

Conference	22nd International Conference on Optical MEMS and Nanophotonics, OMN 2017
Country/Territory	United States
City	Santa Fe
Period	13/08/17 → 17/08/17

Bibliographical note

Publisher Copyright:
© 2017 IEEE.

Keywords

NSOM
photodetector
silicon

Access to Document

10.1109/omn.2017.8051465

Cite this

Karelits, M., Hirshfeld, G., Mandelbaum, Y., Chelly, A., & Karsenty, A. (2017). Nanoscale silicon truncated conical photodetector at subwavelength aperture for NSOM applications. In 2017 International Conference on Optical MEMS and Nanophotonics, OMN 2017 - Proceedings Article 8051465 (International Conference on Optical MEMS and Nanophotonics). IEEE Computer Society. https://doi.org/10.1109/omn.2017.8051465

@inproceedings{e4c4c8bf42e1449dbb35a7aa752df6f3,

title = "Nanoscale silicon truncated conical photodetector at subwavelength aperture for NSOM applications",

abstract = "Silicon-based photodetector sharing subwavelength aperture and shaped as a truncated conical-probe, has been electrically and optically simulated. Designed for NSOM, it may collect near-field surface information with clear advantage of a resolution inaccessible by conventional optical microscopy. Results present a promising device for several wavelengths.",

keywords = "NSOM, photodetector, silicon",

author = "Matityahu Karelits and Gilad Hirshfeld and Yaakov Mandelbaum and Avraham Chelly and Avi Karsenty",

note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 22nd International Conference on Optical MEMS and Nanophotonics, OMN 2017 ; Conference date: 13-08-2017 Through 17-08-2017",

year = "2017",

month = sep,

day = "26",

doi = "10.1109/omn.2017.8051465",

language = "אנגלית",

series = "International Conference on Optical MEMS and Nanophotonics",

publisher = "IEEE Computer Society",

booktitle = "2017 International Conference on Optical MEMS and Nanophotonics, OMN 2017 - Proceedings",

address = "ארצות הברית",

}

Karelits, M, Hirshfeld, G, Mandelbaum, Y, Chelly, A & Karsenty, A 2017, Nanoscale silicon truncated conical photodetector at subwavelength aperture for NSOM applications. in 2017 International Conference on Optical MEMS and Nanophotonics, OMN 2017 - Proceedings., 8051465, International Conference on Optical MEMS and Nanophotonics, IEEE Computer Society, 22nd International Conference on Optical MEMS and Nanophotonics, OMN 2017, Santa Fe, United States, 13/08/17. https://doi.org/10.1109/omn.2017.8051465

Nanoscale silicon truncated conical photodetector at subwavelength aperture for NSOM applications. / Karelits, Matityahu; Hirshfeld, Gilad; Mandelbaum, Yaakov et al.
2017 International Conference on Optical MEMS and Nanophotonics, OMN 2017 - Proceedings. IEEE Computer Society, 2017. 8051465 (International Conference on Optical MEMS and Nanophotonics).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Nanoscale silicon truncated conical photodetector at subwavelength aperture for NSOM applications

AU - Karelits, Matityahu

AU - Hirshfeld, Gilad

AU - Mandelbaum, Yaakov

AU - Chelly, Avraham

AU - Karsenty, Avi

PY - 2017/9/26

Y1 - 2017/9/26

N2 - Silicon-based photodetector sharing subwavelength aperture and shaped as a truncated conical-probe, has been electrically and optically simulated. Designed for NSOM, it may collect near-field surface information with clear advantage of a resolution inaccessible by conventional optical microscopy. Results present a promising device for several wavelengths.

AB - Silicon-based photodetector sharing subwavelength aperture and shaped as a truncated conical-probe, has been electrically and optically simulated. Designed for NSOM, it may collect near-field surface information with clear advantage of a resolution inaccessible by conventional optical microscopy. Results present a promising device for several wavelengths.

KW - NSOM

KW - photodetector

KW - silicon

UR - http://www.scopus.com/inward/record.url?scp=85034955618&partnerID=8YFLogxK

U2 - 10.1109/omn.2017.8051465

DO - 10.1109/omn.2017.8051465

M3 - ???researchoutput.researchoutputtypes.contributiontobookanthology.conference???

AN - SCOPUS:85034955618

T3 - International Conference on Optical MEMS and Nanophotonics

BT - 2017 International Conference on Optical MEMS and Nanophotonics, OMN 2017 - Proceedings

PB - IEEE Computer Society

T2 - 22nd International Conference on Optical MEMS and Nanophotonics, OMN 2017

Y2 - 13 August 2017 through 17 August 2017

ER -

Karelits M, Hirshfeld G, Mandelbaum Y, Chelly A, Karsenty A. Nanoscale silicon truncated conical photodetector at subwavelength aperture for NSOM applications. In 2017 International Conference on Optical MEMS and Nanophotonics, OMN 2017 - Proceedings. IEEE Computer Society. 2017. 8051465. (International Conference on Optical MEMS and Nanophotonics). doi: 10.1109/omn.2017.8051465

Nanoscale silicon truncated conical photodetector at subwavelength aperture for NSOM applications

Abstract

Publication series

Conference

Bibliographical note

Keywords

Access to Document

Other files and links

Fingerprint

Cite this