Silicon-based photodetector sharing subwavelength aperture and shaped as a truncated conical-probe, has been electrically and optically simulated. Designed for NSOM, it may collect near-field surface information with clear advantage of a resolution inaccessible by conventional optical microscopy. Results present a promising device for several wavelengths.
|Title of host publication||2017 International Conference on Optical MEMS and Nanophotonics, OMN 2017 - Proceedings|
|Publisher||IEEE Computer Society|
|State||Published - 26 Sep 2017|
|Event||22nd International Conference on Optical MEMS and Nanophotonics, OMN 2017 - Santa Fe, United States|
Duration: 13 Aug 2017 → 17 Aug 2017
|Name||International Conference on Optical MEMS and Nanophotonics|
|Conference||22nd International Conference on Optical MEMS and Nanophotonics, OMN 2017|
|Period||13/08/17 → 17/08/17|
Bibliographical notePublisher Copyright:
© 2017 IEEE.