Modeling Strain Distribution at the Atomic Level in Doped Ceria Films with Extended X-ray Absorption Fine Structure Spectroscopy

  • Olga Kraynis
  • , Janis Timoshenko
  • , Jiahao Huang
  • , Harishchandra Singh
  • , Ellen Wachtel
  • , Anatoly I. Frenkel
  • , Igor Lubomirsky

Research output: Contribution to journal › Article › peer-review

41 Scopus citations

Fingerprint

Dive into the research topics of 'Modeling Strain Distribution at the Atomic Level in Doped Ceria Films with Extended X-ray Absorption Fine Structure Spectroscopy'. Together they form a unique fingerprint.

Keyphrases

Material Science