Modeling possible defocus and vibration distortions of infra-red images

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Infra-Red (IR) sensors are very common devices for qualitative night observation and intrusion detection. In many applications the IR sensor is being operated from a flying and vibrating platform. In addition in many applications the sensor is required to detect close as well as remote objects. Placing the sensor over a vibrating platform and scanning close and remote objects often creates corresponding distortions over the captured IR image. In this paper a general statistical model for describing the obtained image after incorporating the above-mentioned distortions, is presented. The observed terrain itself is statistically modeled by the first order 2-D Markoff process known from the literature [ 11. The resulted statistical model takes into account various parameters such as the range between the camera and the terrain, the correlation length of the terrain, the type of the vibration and its specifications [2] and the amount of defocus [3]. Special numerical techniques may be applied in order to convert the statistical model into a real 2-D IR image [4]. The formulation derived by this paper may be incorporated in IR simulators that tend to examine the performances of detection algorithms in front of reliable IR images, which take into account various feasible distortions.

Original languageEnglish
Title of host publication21st IEEE Convention of the Electrical and Electronic Engineers in Israel, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages463-467
Number of pages5
ISBN (Electronic)0780358422, 9780780358423
DOIs
StatePublished - 2000
Externally publishedYes
Event21st IEEE Convention of the Electrical and Electronic Engineers in Israel, IEEEI 2000 - Tel-Aviv, Israel
Duration: 11 Apr 200012 Apr 2000

Publication series

Name21st IEEE Convention of the Electrical and Electronic Engineers in Israel, Proceedings

Conference

Conference21st IEEE Convention of the Electrical and Electronic Engineers in Israel, IEEEI 2000
Country/TerritoryIsrael
CityTel-Aviv
Period11/04/0012/04/00

Bibliographical note

Publisher Copyright:
© 2002 IEEE.

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