Abstract
Infra-Red (IR) sensors are very common devices for qualitative night observation and intrusion detection. In many applications the IR sensor is being operated from a flying and vibrating platform. In addition in many applications the sensor is required to detect close as well as remote objects. Placing the sensor over a vibrating platform and scanning close and remote objects often creates corresponding distortions over the captured IR image. In this paper a general statistical model for describing the obtained image after incorporating the above-mentioned distortions, is presented. The observed terrain itself is statistically modeled by the first order 2-D Markoff process known from the literature [ 11. The resulted statistical model takes into account various parameters such as the range between the camera and the terrain, the correlation length of the terrain, the type of the vibration and its specifications [2] and the amount of defocus [3]. Special numerical techniques may be applied in order to convert the statistical model into a real 2-D IR image [4]. The formulation derived by this paper may be incorporated in IR simulators that tend to examine the performances of detection algorithms in front of reliable IR images, which take into account various feasible distortions.
Original language | English |
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Title of host publication | 21st IEEE Convention of the Electrical and Electronic Engineers in Israel, Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 463-467 |
Number of pages | 5 |
ISBN (Electronic) | 0780358422, 9780780358423 |
DOIs | |
State | Published - 2000 |
Externally published | Yes |
Event | 21st IEEE Convention of the Electrical and Electronic Engineers in Israel, IEEEI 2000 - Tel-Aviv, Israel Duration: 11 Apr 2000 → 12 Apr 2000 |
Publication series
Name | 21st IEEE Convention of the Electrical and Electronic Engineers in Israel, Proceedings |
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Conference
Conference | 21st IEEE Convention of the Electrical and Electronic Engineers in Israel, IEEEI 2000 |
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Country/Territory | Israel |
City | Tel-Aviv |
Period | 11/04/00 → 12/04/00 |
Bibliographical note
Publisher Copyright:© 2002 IEEE.