MirrorNPUF: Harvesting Multiple Independent Bits From Each PUF Cell in 65nm

Yizhak Shifman, Alexander Fish, Joseph Shor

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

PUF circuits utilize multiple identical bit-cells to generate their unique keys. Thus, the Si area of each bit has a profound impact on the circuit. A method for extraction of multiple independent bits from single PUF cells is proposed. This method utilizes PUF preselection 'tilt' tests to obtain a new, uncorrelated, entropy source. During tilt tests, intentional controllable mismatch is introduced to the PUF cells, and their stability is concluded. The test could be revisited as a method to measure the internal mismatch size, by finding the tilt size required to flip the test result from 'pass' to 'fail'. As the mismatch size is random and uncorrelated, it could be used to extract multiple additional PUF bits, as well as to find the unstable bit-cells relative to each new PUF bit. A Si implementation, which relies on the capacitive tilt PUF, in TSMC 65nm, is presented, with two additional bits. This demonstrates the applicability of the scheme for multiple new bits. Measured results of the second new bit show BER of 4E-4, zero additional cell area and excellent uniqueness and randomness.

Original languageEnglish
Title of host publicationIEEE International Symposium on Circuits and Systems, ISCAS 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2418-2422
Number of pages5
ISBN (Electronic)9781665484855
DOIs
StatePublished - 2022
Event2022 IEEE International Symposium on Circuits and Systems, ISCAS 2022 - Austin, United States
Duration: 27 May 20221 Jun 2022

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
Volume2022-May
ISSN (Print)0271-4310

Conference

Conference2022 IEEE International Symposium on Circuits and Systems, ISCAS 2022
Country/TerritoryUnited States
CityAustin
Period27/05/221/06/22

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

Funding

This work was supported in part by the Israel Innovation Authority.

FundersFunder number
Israel Innovation Authority

    Keywords

    • Mirror PUF
    • preselection
    • security
    • tilt test

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