Abstract
A simple by-inspection method is described for the z-domain analysis of switched-capacitor networks. The approach is based on the nodal admittance matrix and a concept of basic elements for the switched capacitor.
Original language | English |
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Pages (from-to) | 138-139 |
Number of pages | 2 |
Journal | Electronics Letters |
Volume | 21 |
Issue number | 4 |
DOIs | |
State | Published - 1985 |
Externally published | Yes |
Keywords
- Circuit theory and design
- Switched-capacitor networks