Measuring and Analyzing Defects of Additive Manufactured Ti-6Al-4V Specimens Through Image Segmentation
- Ro'i Lang
- , Or Haim Anidjar
- , Sahar Slonimsky
- , Chen Hajaj
- , Oz Golan
- , Carmel Matias
- , Alex Diskin
- , Strokin Evgeny
- , Mor Mega
- Ariel University
- College of Management Academic Studies Israel
- Afeka Tel Aviv Academic College of Engineering
- Israel Aerospace Industries Ltd.
- Technion-Israel Institute of Technology
Research output: Contribution to journal › Article › peer-review