Abstract
We report a "dip" effect in the Hall resistance, Rxy, of a Si metal-oxide-semiconductor field-effect transistor in the quantum Hall effect regime. With increasing magnetic field, the Hall resistance moves from the plateau at Landau filling factor ν=6 directly to the plateau at ν=4, skipping the plateau at ν=5. However, when the filling factor approaches ν=5, the Hall resistance sharply "dives" to the value 1 5(h e2) characteristic of the ν=5 plateau, and then returns to 1 4(h e2). This is interpreted as a manifestation of the oscillating exchange enhancement of the valley splitting when the Fermi level is in the middle between two adjacent valley-split Landau bands with the asymmetric position of the extended states.
| Original language | English |
|---|---|
| Article number | 205324 |
| Journal | Physical Review B - Condensed Matter and Materials Physics |
| Volume | 73 |
| Issue number | 20 |
| DOIs | |
| State | Published - 2006 |
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