Magnetoresistance scaling in BaRuO3

S. Levy, Y. Kats, M. K. Lee, C. B. Eom, L. Klein

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations

Abstract

We present measurements of electrical resistivity (ρ) and magnetoresistance (Δρ/ρ) in epitaxial thin films of BaRuO3 with a hexagonal four-layer structure. The low-temperature resistivity (3 K<T<20 K) shows a quadratic temperature dependence ρ = ρ0 + aT2. Measurements of magnetoresistance in the temperature range of 5 K<T<50 K and fields up to 8 T reveal a failure of the conventional Kohler's rule. On the other hand, we find that the magnetoresistance data can be scaled if one assumes that the resistivity ρ is related to the scattering time τ as ρ∝1/τα with α≃0.25.

Original languageEnglish
Pages (from-to)795-796
Number of pages2
JournalPhysica B: Condensed Matter
Volume312-313
DOIs
StatePublished - Mar 2002
EventInternational Conference on Strongly Correlated Electrons - Ann Arbor, MI, United States
Duration: 6 Aug 20026 Aug 2002

Bibliographical note

Funding Information:
This research was supported by the Israel Science Foundation founded by the Israel Academy of Sciences and Humanities, and by National Science Foundation Grant No. DMR 980244 and DMR 9973801.

Keywords

  • Magnetoresistance
  • Non-Fermi-liquid bahevior
  • Ruthenates

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