TY - JOUR
T1 - Magnetoresistance in thin films
AU - Kumar, D.
AU - Singh, Rajiv K.
AU - Lee, C.
PY - 1997
Y1 - 1997
N2 - Interesting magnetotransport behavior has been observed in (Formula presented) films. The films are grown in situ on (100) (Formula presented) substrates using a pulsed-laser-deposition technique. Microstructural characterization carried out on these films has shown that the films are smooth, free from impurity phases, and highly textured. The electrical resistance and magnetoresistance (MR) have been measured in the 10-300 K range in magnetic field up to 5 T using a SQUID magnetometer. With the application of magnetic fields of 0.5 and 5 T, the resistance of the films has been found to drop spectacularly, resulting in the realization of MR ratios (at (Formula presented)) as high as (Formula presented) and (Formula presented) respectively.
AB - Interesting magnetotransport behavior has been observed in (Formula presented) films. The films are grown in situ on (100) (Formula presented) substrates using a pulsed-laser-deposition technique. Microstructural characterization carried out on these films has shown that the films are smooth, free from impurity phases, and highly textured. The electrical resistance and magnetoresistance (MR) have been measured in the 10-300 K range in magnetic field up to 5 T using a SQUID magnetometer. With the application of magnetic fields of 0.5 and 5 T, the resistance of the films has been found to drop spectacularly, resulting in the realization of MR ratios (at (Formula presented)) as high as (Formula presented) and (Formula presented) respectively.
UR - http://www.scopus.com/inward/record.url?scp=0000075769&partnerID=8YFLogxK
U2 - 10.1103/PhysRevB.56.13666
DO - 10.1103/PhysRevB.56.13666
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AN - SCOPUS:0000075769
SN - 1098-0121
VL - 56
SP - 13666
EP - 13668
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 21
ER -