Magnetoresistance in Pr0.65Ba0.05Ca0.3MnO3-δ thin films

D. Kumar; Srinivas V. Pietambaram; Rajiv K. Singh; C. B. Lee

Magnetoresistance in Pr_0.65Ba_0.05Ca_0.3MnO_3-δ thin films

D. Kumar, Srinivas V. Pietambaram, Rajiv K. Singh, C. B. Lee

University of Florida

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

Interesting magnetotransport behavior has been observed in Pr_0.65Ba_0.05Ca_0.3MnO_3-δ films (PBCMO or Ba-doped PCMO). The films are grown in-situ on (100) LaAlO₃ substrates using a pulsed laser deposition technique. Microstructural characterization carried out on these films has shown that the films are smooth, free from impurity phases, and highly textured. The electrical resistance and magnetoresistance (MR) have been measured in the 10-300 K range in magnetic field up to 5 T using the SQUID magnetometer. With the application of magnetic fields of 0.5 T and 5 T, the resistance of the films has been found to drop spectacularly, resulting in the realization of MR ratio (at approx. 60 K) as high as 5.3 × 10³ and 5.6 × 10⁸, respectively.

Original language	English
Pages (from-to)	171-175
Number of pages	5
Journal	Materials Research Society Symposium - Proceedings
Volume	517
State	Published - 1998
Externally published	Yes
Event	Proceedings of the 1998 MRS Spring Symposium - San Francisco, CA, USA Duration: 13 Apr 1998 → 15 Apr 1998

Cite this

@article{0bbf4b12624b4f5fac9ad63973152fa6,

title = "Magnetoresistance in Pr0.65Ba0.05Ca0.3MnO3-δ thin films",

abstract = "Interesting magnetotransport behavior has been observed in Pr0.65Ba0.05Ca0.3MnO3-δ films (PBCMO or Ba-doped PCMO). The films are grown in-situ on (100) LaAlO3 substrates using a pulsed laser deposition technique. Microstructural characterization carried out on these films has shown that the films are smooth, free from impurity phases, and highly textured. The electrical resistance and magnetoresistance (MR) have been measured in the 10-300 K range in magnetic field up to 5 T using the SQUID magnetometer. With the application of magnetic fields of 0.5 T and 5 T, the resistance of the films has been found to drop spectacularly, resulting in the realization of MR ratio (at approx. 60 K) as high as 5.3 × 103 and 5.6 × 108, respectively.",

author = "D. Kumar and Pietambaram, {Srinivas V.} and Singh, {Rajiv K.} and Lee, {C. B.}",

year = "1998",

language = "אנגלית",

volume = "517",

pages = "171--175",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Materials Research Society",

note = "Proceedings of the 1998 MRS Spring Symposium ; Conference date: 13-04-1998 Through 15-04-1998",

}

TY - JOUR

T1 - Magnetoresistance in Pr0.65Ba0.05Ca0.3MnO3-δ thin films

AU - Kumar, D.

AU - Pietambaram, Srinivas V.

AU - Singh, Rajiv K.

AU - Lee, C. B.

PY - 1998

Y1 - 1998

N2 - Interesting magnetotransport behavior has been observed in Pr0.65Ba0.05Ca0.3MnO3-δ films (PBCMO or Ba-doped PCMO). The films are grown in-situ on (100) LaAlO3 substrates using a pulsed laser deposition technique. Microstructural characterization carried out on these films has shown that the films are smooth, free from impurity phases, and highly textured. The electrical resistance and magnetoresistance (MR) have been measured in the 10-300 K range in magnetic field up to 5 T using the SQUID magnetometer. With the application of magnetic fields of 0.5 T and 5 T, the resistance of the films has been found to drop spectacularly, resulting in the realization of MR ratio (at approx. 60 K) as high as 5.3 × 103 and 5.6 × 108, respectively.

AB - Interesting magnetotransport behavior has been observed in Pr0.65Ba0.05Ca0.3MnO3-δ films (PBCMO or Ba-doped PCMO). The films are grown in-situ on (100) LaAlO3 substrates using a pulsed laser deposition technique. Microstructural characterization carried out on these films has shown that the films are smooth, free from impurity phases, and highly textured. The electrical resistance and magnetoresistance (MR) have been measured in the 10-300 K range in magnetic field up to 5 T using the SQUID magnetometer. With the application of magnetic fields of 0.5 T and 5 T, the resistance of the films has been found to drop spectacularly, resulting in the realization of MR ratio (at approx. 60 K) as high as 5.3 × 103 and 5.6 × 108, respectively.

UR - http://www.scopus.com/inward/record.url?scp=0032295356&partnerID=8YFLogxK

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.conferencearticle???

AN - SCOPUS:0032295356

SN - 0272-9172

VL - 517

SP - 171

EP - 175

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Proceedings of the 1998 MRS Spring Symposium

Y2 - 13 April 1998 through 15 April 1998

ER -

Magnetoresistance in Pr_0.65Ba_0.05Ca_0.3MnO_3-δ thin films

Abstract

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