Magnetoresistance in Pr0.65Ba0.05Ca0.3MnO3-δ thin films

D. Kumar, Srinivas V. Pietambaram, Rajiv K. Singh, C. B. Lee

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations


Interesting magnetotransport behavior has been observed in Pr0.65Ba0.05Ca0.3MnO3-δ films (PBCMO or Ba-doped PCMO). The films are grown in-situ on (100) LaAlO3 substrates using a pulsed laser deposition technique. Microstructural characterization carried out on these films has shown that the films are smooth, free from impurity phases, and highly textured. The electrical resistance and magnetoresistance (MR) have been measured in the 10-300 K range in magnetic field up to 5 T using the SQUID magnetometer. With the application of magnetic fields of 0.5 T and 5 T, the resistance of the films has been found to drop spectacularly, resulting in the realization of MR ratio (at approx. 60 K) as high as 5.3 × 103 and 5.6 × 108, respectively.

Original languageEnglish
Pages (from-to)171-175
Number of pages5
JournalMaterials Research Society Symposium - Proceedings
StatePublished - 1998
Externally publishedYes
EventProceedings of the 1998 MRS Spring Symposium - San Francisco, CA, USA
Duration: 13 Apr 199815 Apr 1998


Dive into the research topics of 'Magnetoresistance in Pr0.65Ba0.05Ca0.3MnO3-δ thin films'. Together they form a unique fingerprint.

Cite this