Abstract
The magnetic resonance of thin (<1 μm) Ag: Er films, epitaxially grown on cleaved NaCl (001) faces, is reported. An anisotropy associated with the thermal strain is observed. The magnitude of the anisotropy allows for the extraction of the orbit-lattice coupling constant. The angular variation of the linewidth is ascribed to a spatial dependence of the internal strain. It is shown that systematic linewidth studies as a function of film thickness will allow for the extraction of the internal strain distribution for an epitaxially grown film.
| Original language | English |
|---|---|
| Pages (from-to) | 5068-5074 |
| Number of pages | 7 |
| Journal | Physical Review B |
| Volume | 12 |
| Issue number | 11 |
| DOIs | |
| State | Published - 1975 |
| Externally published | Yes |
Bibliographical note
Funding Information:Support is gratefully acknowledged from the John Simon Guggenheim Memorial Foundation in the form of a one-year fellowship grant, during which part of this work was done.
Funding
Support is gratefully acknowledged from the John Simon Guggenheim Memorial Foundation in the form of a one-year fellowship grant, during which part of this work was done.
| Funders | Funder number |
|---|---|
| John Simon Guggenheim Memorial Foundation |