Low-Voltage DML

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

This chapter examines DML performance, energy consumption, static noise margins, delay distribution, robustness, and other design metrics under low-voltage operation. It still focuses on the gate level and DML operations in subthreshold and near-threshold regions...
Original languageEnglish
Title of host publicationDual Mode Logic
Place of PublicationCham, Switzerland
PublisherSpringer
Pages59-73
Number of pages15
DOIs
StatePublished - 16 Dec 2020

Keywords

  • Subthreshold (ST)
  • Near-threshold (NT)
  • Transregional model
  • CMOS
  • Dynamic logic
  • Logical effort
  • Strong inversion
  • On-current
  • Sizing
  • Stacked transistors
  • Adder
  • Monte Carlo
  • Robustness
  • Static noise margin (SNM)
  • Delay–energy
  • DML

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