Abstract
This chapter examines DML performance, energy consumption, static noise margins, delay distribution, robustness, and other design metrics under low-voltage operation. It still focuses on the gate level and DML operations in subthreshold and near-threshold regions...
Original language | English |
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Title of host publication | Dual Mode Logic |
Place of Publication | Cham, Switzerland |
Publisher | Springer |
Pages | 59-73 |
Number of pages | 15 |
DOIs | |
State | Published - 16 Dec 2020 |
Keywords
- Subthreshold (ST)
- Near-threshold (NT)
- Transregional model
- CMOS
- Dynamic logic
- Logical effort
- Strong inversion
- On-current
- Sizing
- Stacked transistors
- Adder
- Monte Carlo
- Robustness
- Static noise margin (SNM)
- Delay–energy
- DML