TY - JOUR
T1 - Low-sensitivity active-RC high- and band-pass second-order sallen & key allpole filters
AU - Jurišić, Dražen
AU - Moschytz, George S.
AU - Mijat, Neven
PY - 2002
Y1 - 2002
N2 - The design procedure of low-sensitivity, low-pass (LP) 2nd-and 3rd-order class-4 Sallen and Key active resistance-capacitance (RC) allpole filters, using impedance tapering, has already been published [1]. In this paper desensitization using impedance tapering is applied to HP and BP 2nd-order filters. It is shown that HP filters have dual properties of LP filters in the sense of sensitivity. Among various topologies of BP filters, the best topology is proposed. The sensitivity of a filter transfer function to component tolerances is examined using the Schoeffler sensitivity measure as a basis for comparison. Monte Carlo runs are performed as a double-check. The component values, selected for impedance tapering, account for the considerable decrease in sensitivities to component tolerances for the LP as well as for the HP and BP filters.
AB - The design procedure of low-sensitivity, low-pass (LP) 2nd-and 3rd-order class-4 Sallen and Key active resistance-capacitance (RC) allpole filters, using impedance tapering, has already been published [1]. In this paper desensitization using impedance tapering is applied to HP and BP 2nd-order filters. It is shown that HP filters have dual properties of LP filters in the sense of sensitivity. Among various topologies of BP filters, the best topology is proposed. The sensitivity of a filter transfer function to component tolerances is examined using the Schoeffler sensitivity measure as a basis for comparison. Monte Carlo runs are performed as a double-check. The component values, selected for impedance tapering, account for the considerable decrease in sensitivities to component tolerances for the LP as well as for the HP and BP filters.
UR - http://www.scopus.com/inward/record.url?scp=0036292927&partnerID=8YFLogxK
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AN - SCOPUS:0036292927
SN - 0271-4310
VL - 4
SP - IV/241-IV/244
JO - Proceedings - IEEE International Symposium on Circuits and Systems
JF - Proceedings - IEEE International Symposium on Circuits and Systems
T2 - 2002 IEEE International Symposium on Circuits and Systems
Y2 - 26 May 2002 through 29 May 2002
ER -