Longitudinal resistivity in the quantum Hall effect regime in a split-gate Si MOSFET with variable electron density

I. Shlimak, K. J. Friedland, S. V. Kravchenko, V. Ginodman, A. Butenko, T. M. Klapwijk

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

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Physics

Engineering

Material Science