Laser-induced focusing for silicon nanoscopy

Nadav Shabairou, Maor Tiferet, Zeev Zalevsky, Moshe Sinvani

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations


We demonstrate the shaping and focusing of a probe IR (λ=1.55μm) laser beam in silicon. The shaping was done by a second pump laser beam at λ=0.775μm and 30ps pulse width which simultaneously and collinearly, illuminates the silicon surface with the IR beam. The shaped probe beam will be used in silicon nanoscopy.

Original languageEnglish
Title of host publicationFrontiers in Optics - Proceedings Frontiers in Optics / Laser Science, Part of Frontiers in Optics + Laser Science APS/DLS, FiO 2020
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)9781943580804
StatePublished - 14 Sep 2020
Event2020 Frontiers in Optics Conference, FiO 2020 - Washington, United States
Duration: 14 Sep 202017 Sep 2020

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701


Conference2020 Frontiers in Optics Conference, FiO 2020
Country/TerritoryUnited States

Bibliographical note

Publisher Copyright:
© OSA 2020 © 2020 The Author(s)


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