TY - JOUR
T1 - Laser beam scanning using near-field scanning optical microscopy nanoscale silicon-based photodetector
AU - Karelits, Matityahu
AU - Mandelbaum, Yaakov
AU - Chelly, Avraham
AU - Karsenty, Avi
N1 - Publisher Copyright:
© 2018 The Authors.
PY - 2018/7/1
Y1 - 2018/7/1
N2 - As part of the efforts to enhance the near-field scanning optical microscopy and the detection of evanescent waves, a silicon Schottky diode, shaped as a truncated trapezoid photodetector and sharing a subwavelength pin-hole aperture, has been designed and simulated. Using finite elements method and two-dimensional advanced simulations, the detector has been horizontally shifted across a vertically oriented Gaussian beam, which is projected on top of the device. Both electrical and electro-optical simulations have been conducted. These results are promising toward the fabrication of a new generation of photodetector devices.
AB - As part of the efforts to enhance the near-field scanning optical microscopy and the detection of evanescent waves, a silicon Schottky diode, shaped as a truncated trapezoid photodetector and sharing a subwavelength pin-hole aperture, has been designed and simulated. Using finite elements method and two-dimensional advanced simulations, the detector has been horizontally shifted across a vertically oriented Gaussian beam, which is projected on top of the device. Both electrical and electro-optical simulations have been conducted. These results are promising toward the fabrication of a new generation of photodetector devices.
KW - evanescent waves
KW - finite elements method
KW - near-field scanning optical microscopy
KW - photodetector
KW - pin-hole subwavelength aperture
KW - silicon
KW - two-dimensional simulations
UR - http://www.scopus.com/inward/record.url?scp=85050692379&partnerID=8YFLogxK
U2 - 10.1117/1.JNP.12.036002
DO - 10.1117/1.JNP.12.036002
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AN - SCOPUS:85050692379
SN - 1934-2608
VL - 12
JO - Journal of Nanophotonics
JF - Journal of Nanophotonics
IS - 3
M1 - 036002
ER -