Laser beam scanning using near-field scanning optical microscopy nanoscale silicon-based photodetector

Matityahu Karelits, Yaakov Mandelbaum, Avraham Chelly, Avi Karsenty

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

As part of the efforts to enhance the near-field scanning optical microscopy and the detection of evanescent waves, a silicon Schottky diode, shaped as a truncated trapezoid photodetector and sharing a subwavelength pin-hole aperture, has been designed and simulated. Using finite elements method and two-dimensional advanced simulations, the detector has been horizontally shifted across a vertically oriented Gaussian beam, which is projected on top of the device. Both electrical and electro-optical simulations have been conducted. These results are promising toward the fabrication of a new generation of photodetector devices.

Original languageEnglish
Article number036002
JournalJournal of Nanophotonics
Volume12
Issue number3
DOIs
StatePublished - 1 Jul 2018

Bibliographical note

Publisher Copyright:
© 2018 The Authors.

Keywords

  • evanescent waves
  • finite elements method
  • near-field scanning optical microscopy
  • photodetector
  • pin-hole subwavelength aperture
  • silicon
  • two-dimensional simulations

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