Large-Velocity Saturation in Thin-Film Black Phosphorus Transistors

Xiaolong Chen, Chen Chen, Adi Levi, Lothar Houben, Bingchen Deng, Shaofan Yuan, Chao Ma, Kenji Watanabe, Takashi Taniguchi, Doron Naveh, Xu Du, Fengnian Xia

Research output: Contribution to journalArticlepeer-review

43 Scopus citations

Abstract

A high saturation velocity semiconductor is appealing for applications in electronics and optoelectronics. Thin-film black phosphorus (BP), an emerging layered semiconductor, shows a high carrier mobility and strong mid-infrared photoresponse at room temperature. Here, we report the observation of high intrinsic saturation velocity in 7 to 11 nm thick BP for both electrons and holes as a function of charge-carrier density, temperature, and crystalline direction. We distinguish a drift velocity transition point due to the competition between the electron-impurity and electron-phonon scatterings. We further achieve a room-temperature saturation velocity of 1.2 (1.0) × 107 cm s-1 for hole (electron) carriers at a critical electric field of 14 (13) kV cm-1, indicating an intrinsic current-gain cutoff frequency ∼20 GHz·μm for radio frequency applications. Moreover, the current density is as high as 580 μA μm-1 at a low electric field of 10 kV cm-1. Our studies demonstrate that thin-film BP outperforms silicon in terms of saturation velocity and critical field, revealing its great potential in radio-frequency electronics, high-speed mid-infrared photodetectors, and optical modulators.

Original languageEnglish
Pages (from-to)5003-5010
Number of pages8
JournalACS Nano
Volume12
Issue number5
DOIs
StatePublished - 22 May 2018

Bibliographical note

Publisher Copyright:
© 2018 American Chemical Society.

Funding

F.X. acknowledges the support by the Office of Naval Research Young Investigator Program (ONR-YIP). Facilities use in Yale was partially supported by the Yale Institute for Nanoscience and Quantum Engineering (YINQE) and NSF MRSEC DMR 1119826. K.W. and T.T. acknowledge support from the Elemental Strategy Initiative conducted by the MEXT, Japan, and the CREST (JPMJCR15F3), JST. D.N. acknowledges the support of the Israel Science Foundation in Grant Number 1055/15. F.X. acknowledges the support by the Office of Naval Research Young Investigator Program (ONR-YIP). Facilities use in Yale was partially supported by the Yale Institute for Nanoscience and Quantum Engineering (YINQE) and NSF MRSEC DMR 1119826. K.W. and T.T. acknowledge support from the Elemental Strategy Initiative conducted by the MEXT, Japan and the CREST (JPMJCR15F3), JST. D.N. acknowledges the support of the Israel Science Foundation in Grant Number 1055/15.

FundersFunder number
ONR-YIP
Yale Institute for Nanoscience and Quantum Engineering
Office of Naval Research
Materials Research Science and Engineering Center, Harvard UniversityDMR 1119826
Japan Science and Technology Corporation
Ministry of Education, Culture, Sports, Science and Technology
Japan Science and Technology Agency
Core Research for Evolutional Science and TechnologyJPMJCR15F3
Israel Science Foundation1055/15

    Keywords

    • black phosphorus
    • drift velocity
    • electron-impurity scattering
    • electron?phonon scattering
    • field-effect transistors
    • saturation velocity

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