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Large-Scale Strain Measurement for OFDR via Permanent-Scatterer-Based Distance Repositioning

  • Xinyue Yu
  • , Xing Liu
  • , Dexin Ba
  • , Yongkang Dong

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Large-scale strain (i.e., extensive deformation over long gauge lengths in optical fibers) introduces significant distortions in distance referencing for spectrum-based optical frequency-domain reflectometry (OFDR), leading to severe positional segment mismatches and degraded measurement accuracy. To address this issue, this letter proposes a distance reposition method (DRM) that utilizes a femtosecond-laser-inscribed permanent scatterer (PS) array as intrinsic reference markers within the fiber. By realigning adjacent fiber segments to the repositioned PS locations, the DRM achieves effective self-correction of strain-induced spatial mismatches during each local demodulation process. This enhances both the correlation and accuracy of the Rayleigh backscattering (RBS) spectra derived from reference and measurement signals. The PS array was fabricated at 12 cm intervals over a 2.29 m region, exhibiting an approximate 25 dB signal enhancement with negligible insertion loss. Experimental results confirm that the DRM substantially improves large-scale strain sensing performance, enabling distributed strain measurements of up to 5000 µε over a 1 m segment with a spatial resolution of 6.4 mm. The proposed technique offers a simple and practical solution for high-accuracy distributed large-scale strain sensing in OFDR systems.

Original languageEnglish
Title of host publicationFourteenth National Conference on Photonics
EditorsYongkang Dong, Hongwei Li
PublisherSPIE
ISBN (Electronic)9781510699182
DOIs
StatePublished - 2 Dec 2025
Externally publishedYes
Event14th National Conference on Photonics - Harbin, China
Duration: 15 Aug 202517 Aug 2025

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13986
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference14th National Conference on Photonics
Country/TerritoryChina
CityHarbin
Period15/08/2517/08/25

Bibliographical note

Publisher Copyright:
© 2025 SPIE.

Keywords

  • Optical frequency domain reflectometer
  • large-scale strain
  • permanent scatters

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