Abstract
The basal plane transport critical current density Jc of YBCO epitaxial thin films is strongly anisotropic, leading to large enhancements of Jc when H is precisely parallel to the copper-oxygen planes. Experimental evidence shows that the enhancement is a bulk phenomenon, and the orientation dependence is compared with a model of “intrinsic flux pinning” by the layered crystal structure.
| Original language | English |
|---|---|
| Pages (from-to) | 1415-1416 |
| Number of pages | 2 |
| Journal | Physica B: Condensed Matter |
| Volume | 165-166 |
| DOIs | |
| State | Published - 1990 |
| Externally published | Yes |
Funding
*Research sponsored by the Division of Materials Sciences, U.S. Department of Energy under contract DE-AC05-840R21400 with Martin-Marietta Energy Systems, Inc.
| Funders | Funder number |
|---|---|
| Division of Materials Sciences | |
| U.S. Department of Energy | DE-AC05-840R21400 |