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Large, orientation-dependent enhancements of critical currents in Y1Ba2Cu3O7−x epitaxial thin films: Evidence for intrinsic flux pinning?

  • D. K. Christen
  • , C. E. Klabunde
  • , R. Feenstra
  • , D. H. Lowndes
  • , D. Norton
  • , J. D. Budai
  • , H. R. Kerchner
  • , J. R. Thompson
  • , L. A. Boatner
  • , J. Narayan
  • , R. Singh
  • Oak Ridge National Laboratory
  • North Carolina State University

Research output: Contribution to journal › Article › peer-review

23 Scopus citations

Abstract

The basal plane transport critical current density Jc of YBCO epitaxial thin films is strongly anisotropic, leading to large enhancements of Jc when H is precisely parallel to the copper-oxygen planes. Experimental evidence shows that the enhancement is a bulk phenomenon, and the orientation dependence is compared with a model of “intrinsic flux pinning” by the layered crystal structure.

Original languageEnglish
Pages (from-to)1415-1416
Number of pages2
JournalPhysica B: Condensed Matter
Volume165-166
DOIs
StatePublished - 1990
Externally publishedYes

Funding

*Research sponsored by the Division of Materials Sciences, U.S. Department of Energy under contract DE-AC05-840R21400 with Martin-Marietta Energy Systems, Inc.

FundersFunder number
Division of Materials Sciences
U.S. Department of EnergyDE-AC05-840R21400

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