Large, orientation-dependent enhancements of critical currents in Y1Ba2Cu3O7−x epitaxial thin films: Evidence for intrinsic flux pinning?

D. K. Christen, C. E. Klabunde, R. Feenstra, D. H. Lowndes, D. Norton, J. D. Budai, H. R. Kerchner, J. R. Thompson, L. A. Boatner, J. Narayan, R. Singh

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

Abstract

The basal plane transport critical current density Jc of YBCO epitaxial thin films is strongly anisotropic, leading to large enhancements of Jc when H is precisely parallel to the copper-oxygen planes. Experimental evidence shows that the enhancement is a bulk phenomenon, and the orientation dependence is compared with a model of “intrinsic flux pinning” by the layered crystal structure.

Original languageEnglish
Pages (from-to)1415-1416
Number of pages2
JournalPhysica B: Condensed Matter
Volume165-166
DOIs
StatePublished - 1990
Externally publishedYes

Funding

*Research sponsored by the Division of Materials Sciences, U.S. Department of Energy under contract DE-AC05-840R21400 with Martin-Marietta Energy Systems, Inc.

FundersFunder number
Division of Materials Sciences
U.S. Department of EnergyDE-AC05-840R21400

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