Abstract
In recent years, image-scanning microscopy (ISM, also termed pixel-reassignment microscopy) has emerged as a technique that improves the resolution and signal-to-noise compared to confocal and widefield microscopy by employing a detector array at the image plane of a confocal laser scanning microscope. Here, we present a k-space analysis of coherent ISM, showing that ISM is equivalent to spotlight synthetic-aperture radar and analogous to oblique-illumination microscopy. This insight indicates that ISM can be performed with a single detector placed in the k-space of the sample, which we numerically demonstrate.
Original language | English |
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Article number | 141106 |
Journal | Applied Physics Letters |
Volume | 122 |
Issue number | 14 |
DOIs | |
State | Published - 3 Apr 2023 |
Externally published | Yes |
Bibliographical note
Publisher Copyright:© 2023 Author(s).