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Junction sharpness in field-induced transistor structures in CuxAg1-xInSe2

  • N. S. McAlpine
  • , P. McConville
  • , D. Haneman
  • , L. Chernyak
  • , D. Cahen
  • University of New South Wales
  • Weizmann Institute of Science

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

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