Interferometric localization microscopy

Carl G. Ebeling, Amihai Meiri, Erik M. Jorgensen, Zeev Zalevsky, Jordan M. Gerton, Rajesh Menon

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


Interference of signal in Fourier space, emitted from single probes, is used to localize it by recording and computing the phase of the fringes. Such system has applications in super resolution localization microscopy.

Original languageEnglish
Title of host publicationImaging and Applied Optics - Imaging Systems and Applications, ISA 2014
PublisherOptical Society of American (OSA)
ISBN (Print)9781557523082
StatePublished - 2014
EventImaging Systems and Applications, ISA 2014 - Seattle, WA, United States
Duration: 13 Jul 201417 Jul 2014

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701


ConferenceImaging Systems and Applications, ISA 2014
Country/TerritoryUnited States
CitySeattle, WA


Dive into the research topics of 'Interferometric localization microscopy'. Together they form a unique fingerprint.

Cite this