Interference based localization of single emitters

Amihai Meiri, Carl G. Ebeling, Jason Martineau, Zeev Zalevsky, Jordan M. Gerton, Rajesh Menon

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

The ability to localize precisely a single optical emitter is important for particle tracking applications and super resolution microscopy. It is known that for a traditional microscope the ability to localize such an emitter is limited by the photon count. Here we analyze the ability to improve such localization by imposing interference fringes. We show here that a simple grating interferometer can introduce such improvement in certain circumstances and analyze what is required to increase the localization precision further.

Original languageEnglish
Pages (from-to)17174-17191
Number of pages18
JournalOptics Express
Volume25
Issue number15
DOIs
StatePublished - 24 Jul 2017

Bibliographical note

Publisher Copyright:
© 2017 Optical Society of America.

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