Interference based localization of single emitters

Amihai Meiri; Carl G. Ebeling; Jason Martineau; Zeev Zalevsky; Jordan M. Gerton; Rajesh Menon

doi:10.1364/OE.25.017174

Interference based localization of single emitters

Amihai Meiri, Carl G. Ebeling, Jason Martineau, Zeev Zalevsky, Jordan M. Gerton, Rajesh Menon

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

The ability to localize precisely a single optical emitter is important for particle tracking applications and super resolution microscopy. It is known that for a traditional microscope the ability to localize such an emitter is limited by the photon count. Here we analyze the ability to improve such localization by imposing interference fringes. We show here that a simple grating interferometer can introduce such improvement in certain circumstances and analyze what is required to increase the localization precision further.

Original language	English
Pages (from-to)	17174-17191
Number of pages	18
Journal	Optics Express
Volume	25
Issue number	15
DOIs	https://doi.org/10.1364/OE.25.017174
State	Published - 24 Jul 2017

Bibliographical note

Funding Information:
National Science Foundation (NSF) (DBI-0845193, 10030539, 1309041); National Institutes of Health (NIH) (R01 NS034307); Utah Science Technology and Research (USTAR) initiative.

Publisher Copyright:
© 2017 Optical Society of America.

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10.1364/OE.25.017174

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Interference based localization of single emitters

Abstract

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