Interface Growth: Fluctuations and the Correlation Length

I Hecht, A Be'er, H. Taitelbaum

Research output: Contribution to journalArticlepeer-review

Abstract

Growth behavior of interfaces is usually described by a power-law of the growing interface width with time. This general scaling picture is an average behavior description, which may not be valid when only a finite number of interfaces is considered. In this work we study theoretically and experimentally the growth behavior of single interfaces and show that the particular growth function of the width always exhibits a non-monotonic, fluctuating behavior. This behavior results from competing mechanisms of normal growth and surface tension forces in the Quenched-noise Kardar-Parisi-Zhang (QKPZ) equation, and contains information on the growth process in this specific interface. We define a new measure of the interface width fluctuations in order to extract this information from experimental data. We analyze data of mercury droplets spreading on silver films, as well as data of water spreading on paper, in order to demonstrate the validity of our claim in a wide range of growing interfaces. The experimental results are compared to the numerical results of the QKPZ equation, for different cases of noise distributions
Original languageAmerican English
Pages (from-to)319-324
JournalFluctuation and Noise Letters
Volume5
StatePublished - 2005

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