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Influence of Ge nanocrystals and radiation defects on C-V characteristics in Si-MOS structures

  • Shai Levy
  • , Issai Shlimak
  • , Avraham Chelly
  • , Zeev Zalevsky
  • , Tiecheng Lu
  • Bar-Ilan University
  • Ministry of Education, China

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

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