Abstract
We present a critical review of the present state of the critical exponent puzzle of the metal-insulator transition of doped semiconductors with emphasis on the role of meso-and macroscopic inhomogeneity caused by the disorder of intended or unintended acceptors and donors in crystals. By using both isotopic engineering and neutron transmutation doping (NTD) of germanium we found for low compensations (at K = 1.4 and 12%) that the critical exponents of the localization length and the dielectric constant are nearly v= 1/2 and ζ= 1, which double for medium compensations (at K = 38 and 54%) to v=1 and ζ=2, respectively.
Original language | English |
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Pages (from-to) | 757-760 |
Number of pages | 4 |
Journal | Physics of the Solid State |
Volume | 41 |
Issue number | 5 |
DOIs | |
State | Published - May 1999 |
Bibliographical note
Funding Information:This work was only possible by financial support of the RFFI (Grant N 97-02-18280), INTAS Grant (93-1555/Ext.), German–Israeli Foundation (Grant N I-0319-199.07) and the British–German Foundation (Grant N 313/ARC 93-97).
Funding
This work was only possible by financial support of the RFFI (Grant N 97-02-18280), INTAS Grant (93-1555/Ext.), German–Israeli Foundation (Grant N I-0319-199.07) and the British–German Foundation (Grant N 313/ARC 93-97).
Funders | Funder number |
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British–German Foundation | N 313/ARC 93-97 |
INTAS | 93-1555/Ext. |
Russian Foundation for Fundamental Investigations | N 97-02-18280 |
German-Israeli Foundation for Scientific Research and Development | N I-0319-199.07 |