Increased localization precision by interference fringe analysis

Carl G. Ebeling, Amihai Meiri, Jason Martineau, Zeev Zalevsky, Jordan M. Gerton, Rajesh Menon

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

We report a novel optical single-emitter-localization methodology that uses the phase induced by path length differences in a Mach-Zehnder interferometer to improve localization precision. Using information theory, we demonstrate that the localization capability of a modified Fourier domain signal generated by photon interference enables a more precise localization compared to a standard Gaussian intensity distribution of the corresponding point-spread function. The calculations were verified by numerical simulations and an exemplary experiment, where the centers of metal nanoparticles were localized to a precision of 3 nm.

Original languageEnglish
Pages (from-to)10430-10437
Number of pages8
JournalNanoscale
Volume7
Issue number23
DOIs
StatePublished - 21 Jun 2015

Bibliographical note

Publisher Copyright:
© 2014 The Royal Society of Chemistry.

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