In-Plane Impedance Spectroscopy measurements in Vanadium Dioxide thin films

Juan Ramirez, Edgar Patino, Rainer Schmidt, Amos Sharoni, Maria Gomez, Ivan Schuller

Research output: Contribution to journal › Meeting Abstract › peer-review

Original language	English
Article number	D5.00010
Journal	Bulletin of the American Physical Society
Volume	57
Issue number	1
State	Published - Mar 2012

Cite this

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title = "In-Plane Impedance Spectroscopy measurements in Vanadium Dioxide thin films",

author = "Juan Ramirez and Edgar Patino and Rainer Schmidt and Amos Sharoni and Maria Gomez and Ivan Schuller",

year = "2012",

month = mar,

language = "אנגלית",

volume = "57",

journal = "Bulletin of the American Physical Society",

publisher = "American Physical Society (APS)",

number = "1",

}

TY - JOUR

T1 - In-Plane Impedance Spectroscopy measurements in Vanadium Dioxide thin films

AU - Ramirez, Juan

AU - Patino, Edgar

AU - Schmidt, Rainer

AU - Sharoni, Amos

AU - Gomez, Maria

AU - Schuller, Ivan

PY - 2012/3

Y1 - 2012/3

UR - https://meetings.aps.org/Meeting/MAR12/Event/160373

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VL - 57

JO - Bulletin of the American Physical Society

JF - Bulletin of the American Physical Society

IS - 1

M1 - D5.00010

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