Improving the sensitivity of scanning probe microscopy with mechanical vibrations

Eylon Persky, Naor Vardi, Yishai Shperber, Beena Kalisky

Research output: Contribution to journalArticlepeer-review

1 Scopus citations


Mechanical vibrations are typically undesired in imaging systems, as they cause noise and hinder system performance. Here, we propose to use vibrations in order to improve the sensitivity of a scanning probe system. We model the spectral and spatial structures of the response to an induced vibration and test our calculation on magnetic objects using a scanning superconducting quantum interference device microscope. In our experiments, we show that imaging the response to vibrations enhances the sensitivity of our sensor, as we detect signals that would otherwise be below the sensor's low frequency noise limit. Our results open the door to an effective way of improving the performance of many imaging systems.

Original languageEnglish
Article number173101
Number of pages5
JournalApplied Physics Letters
Issue number17
StatePublished - 22 Oct 2018

Bibliographical note

Funding Information:
This research was supported by the European Research Council Grant No. ERC-2014-STG-639792, the Israeli Science Foundation Grant No. ISF-1281/17, COST Action CA16218, and the QuantERA ERA-NET Cofund in Quantum Technologies (Project No. 731473).

Publisher Copyright:
© 2018 Author(s).


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