Improving the sensitivity of scanning probe microscopy with mechanical vibrations

Eylon Persky; Naor Vardi; Yishai Shperber; Beena Kalisky

doi:10.1063/1.5051620

Improving the sensitivity of scanning probe microscopy with mechanical vibrations

Eylon Persky, Naor Vardi, Yishai Shperber, Beena Kalisky

Department of Physics

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Mechanical vibrations are typically undesired in imaging systems, as they cause noise and hinder system performance. Here, we propose to use vibrations in order to improve the sensitivity of a scanning probe system. We model the spectral and spatial structures of the response to an induced vibration and test our calculation on magnetic objects using a scanning superconducting quantum interference device microscope. In our experiments, we show that imaging the response to vibrations enhances the sensitivity of our sensor, as we detect signals that would otherwise be below the sensor's low frequency noise limit. Our results open the door to an effective way of improving the performance of many imaging systems.

Original language	English
Article number	173101
Journal	Applied Physics Letters
Volume	113
Issue number	17
DOIs	https://doi.org/10.1063/1.5051620
State	Published - 22 Oct 2018

Bibliographical note

Publisher Copyright:
© 2018 Author(s).

Funding

This research was supported by the European Research Council Grant No. ERC-2014-STG-639792, the Israeli Science Foundation Grant No. ISF-1281/17, COST Action CA16218, and the QuantERA ERA-NET Cofund in Quantum Technologies (Project No. 731473).

Funders	Funder number
Israeli Science Foundation	ISF-1281/17
Horizon 2020 Framework Programme	639792
European Commission
European Cooperation in Science and Technology	731473, CA16218

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10.1063/1.5051620

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Improving the sensitivity of scanning probe microscopy with mechanical vibrations

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