Improving failure analysis navigation using optical super resolved imaging

Keyphrases

• Captured Images 50%
• Failure Analysis 100%
• High-resolution 50%
• Low Contrast 50%
• Microelectronic chip 50%
• Region of Interest 50%
• Resolution Improvement 50%
• Resolving Power 50%
• Super-resolved Imaging 100%

Engineering

• Captured Image 50%
• Failure Analysis 100%
• High Resolution 50%
• Low Resolution Image 50%
• Microelectronics 50%
• Numerical Approach 50%
• Region of Interest 50%

Earth and Planetary Sciences

• Failure Analysis 100%