Abstract
The performance of the high-bandgap Cu(Ga,In)Se2-based solar cells is still limited by moderate fill factors and short-circuit currents due to incomplete carrier collection. A high recombination velocity at grain surfaces may be responsible for this behavior. In order to improve the performance, etching and passivating treatments with Br2-MeOH and KCN have been performed on Ga-rich absorbers, significantly increasing the fill factor and short-circuit current density. Fill factors of up to 56% were achieved for CuGaSe2/(Zn,Cd)S. The influence of the treatments on the absorber films was analyzed by various means. EDS analysis, scanning electron micrographs, and electrical measurements of conductivity and carrier density prove the removal of Cu2-xSe by KCN dip from Cu-rich films. In stoichiometric or Cu-poor films, no change can be seen by these methods.
Original language | English |
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Pages (from-to) | 481-486 |
Number of pages | 6 |
Journal | Conference Record of the IEEE Photovoltaic Specialists Conference |
Volume | 1 |
State | Published - May 1990 |
Externally published | Yes |
Event | Twenty First IEEE Photovoltaic Specialists Conference - 1990 Part 2 (of 2) - Kissimimee, FL, USA Duration: 21 May 1990 → 25 May 1990 |