Improvement in In-Plane Localization Precision of Nanoparticles Using Interference Analysis

A Meiri; C Ebeling; J Martineau; Z Zalevsky; J Gerton; R Menon

Improvement in In-Plane Localization Precision of Nanoparticles Using Interference Analysis

A Meiri, C Ebeling, J Martineau, Z Zalevsky, J Gerton, R Menon

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We present a method to improve the localization precision of nanoparticles over Gaussian fitting by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.

Original language	American English
Title of host publication	CLEO: QELS_Fundamental Science 2015
Publisher	Optical Society of America
State	Published - 2015

Bibliographical note

Place of conference:USA

Cite this

@inproceedings{e8788d3b1afc4090a71745179edbbedb,

title = "Improvement in In-Plane Localization Precision of Nanoparticles Using Interference Analysis",

abstract = "We present a method to improve the localization precision of nanoparticles over Gaussian fitting by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.",

author = "A Meiri and C Ebeling and J Martineau and Z Zalevsky and J Gerton and R Menon",

note = "Place of conference:USA",

year = "2015",

language = "American English",

booktitle = "CLEO: QELS\_Fundamental Science 2015",

publisher = "Optical Society of America",

}

TY - GEN

T1 - Improvement in In-Plane Localization Precision of Nanoparticles Using Interference Analysis

AU - Meiri, A

AU - Ebeling, C

AU - Martineau, J

AU - Zalevsky, Z

AU - Gerton, J

AU - Menon, R

N1 - Place of conference:USA

PY - 2015

Y1 - 2015

N2 - We present a method to improve the localization precision of nanoparticles over Gaussian fitting by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.

AB - We present a method to improve the localization precision of nanoparticles over Gaussian fitting by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.

UR - https://scholar.google.co.il/scholar?q=Improvement+in+In-Plane+Localization+Precision+of+Nanoparticles+Using+Interference+Analysis&btnG=&hl=en&as_sdt=0%2C5

M3 - Conference contribution

BT - CLEO: QELS_Fundamental Science 2015

PB - Optical Society of America

ER -

Improvement in In-Plane Localization Precision of Nanoparticles Using Interference Analysis

Abstract

Bibliographical note

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