Improvement in In-Plane Localization Precision of Nanoparticles Using Interference Analysis

A Meiri, C Ebeling, J Martineau, Z Zalevsky, J Gerton, R Menon

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present a method to improve the localization precision of nanoparticles over Gaussian fitting by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.
Original languageAmerican English
Title of host publicationCLEO: QELS_Fundamental Science 2015
PublisherOptical Society of America
StatePublished - 2015

Bibliographical note

Place of conference:USA

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