Improvement in in-plane localization precision of nanoparticles using interference analysis

Amihai Meiri; Carl G. Ebeling; Jason Martineau; Zeev Zalevsky; Jordan M. Gerton; Rajesh Menon

Improvement in in-plane localization precision of nanoparticles using interference analysis

Amihai Meiri
, Carl G. Ebeling
, Jason Martineau
, Zeev Zalevsky
, Jordan M. Gerton
, Rajesh Menon

University of Utah

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We present a method to improve the localization precision of nanoparticles over Gaussian fitting by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.

Original language	English
Title of host publication	2015 Conference on Lasers and Electro-Optics, CLEO 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781557529688
State	Published - 10 Aug 2015
Event	Conference on Lasers and Electro-Optics, CLEO 2015 - San Jose, United States Duration: 10 May 2015 → 15 May 2015

Publication series

Name	Conference on Lasers and Electro-Optics Europe - Technical Digest
Volume	2015-August

Conference

Conference	Conference on Lasers and Electro-Optics, CLEO 2015
Country/Territory	United States
City	San Jose
Period	10/05/15 → 15/05/15

Bibliographical note

Publisher Copyright:
© 2015 OSA.

Keywords

Cities and towns
Fitting
Gratings
Image resolution
Interference
Microscopy
Nanoparticles

Cite this

Meiri, A., Ebeling, C. G., Martineau, J., Zalevsky, Z., Gerton, J. M., & Menon, R. (2015). Improvement in in-plane localization precision of nanoparticles using interference analysis. In 2015 Conference on Lasers and Electro-Optics, CLEO 2015 Article 7183678 (Conference on Lasers and Electro-Optics Europe - Technical Digest; Vol. 2015-August). Institute of Electrical and Electronics Engineers Inc..

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title = "Improvement in in-plane localization precision of nanoparticles using interference analysis",

abstract = "We present a method to improve the localization precision of nanoparticles over Gaussian fitting by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.",

keywords = "Cities and towns, Fitting, Gratings, Image resolution, Interference, Microscopy, Nanoparticles",

author = "Amihai Meiri and Ebeling, \{Carl G.\} and Jason Martineau and Zeev Zalevsky and Gerton, \{Jordan M.\} and Rajesh Menon",

note = "Publisher Copyright: {\textcopyright} 2015 OSA.; Conference on Lasers and Electro-Optics, CLEO 2015 ; Conference date: 10-05-2015 Through 15-05-2015",

year = "2015",

month = aug,

day = "10",

language = "אנגלית",

series = "Conference on Lasers and Electro-Optics Europe - Technical Digest",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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Meiri, A, Ebeling, CG, Martineau, J, Zalevsky, Z, Gerton, JM & Menon, R 2015, Improvement in in-plane localization precision of nanoparticles using interference analysis. in 2015 Conference on Lasers and Electro-Optics, CLEO 2015., 7183678, Conference on Lasers and Electro-Optics Europe - Technical Digest, vol. 2015-August, Institute of Electrical and Electronics Engineers Inc., Conference on Lasers and Electro-Optics, CLEO 2015, San Jose, United States, 10/05/15.

Improvement in in-plane localization precision of nanoparticles using interference analysis. / Meiri, Amihai; Ebeling, Carl G.; Martineau, Jason et al.
2015 Conference on Lasers and Electro-Optics, CLEO 2015. Institute of Electrical and Electronics Engineers Inc., 2015. 7183678 (Conference on Lasers and Electro-Optics Europe - Technical Digest; Vol. 2015-August).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Improvement in in-plane localization precision of nanoparticles using interference analysis

AU - Meiri, Amihai

AU - Ebeling, Carl G.

AU - Martineau, Jason

AU - Zalevsky, Zeev

AU - Gerton, Jordan M.

AU - Menon, Rajesh

PY - 2015/8/10

Y1 - 2015/8/10

N2 - We present a method to improve the localization precision of nanoparticles over Gaussian fitting by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.

AB - We present a method to improve the localization precision of nanoparticles over Gaussian fitting by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.

KW - Cities and towns

KW - Fitting

KW - Gratings

KW - Image resolution

KW - Interference

KW - Microscopy

KW - Nanoparticles

UR - https://www.scopus.com/pages/publications/84954060988

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AN - SCOPUS:84954060988

T3 - Conference on Lasers and Electro-Optics Europe - Technical Digest

BT - 2015 Conference on Lasers and Electro-Optics, CLEO 2015

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - Conference on Lasers and Electro-Optics, CLEO 2015

Y2 - 10 May 2015 through 15 May 2015

ER -

Improvement in in-plane localization precision of nanoparticles using interference analysis

Abstract

Publication series

Conference

Bibliographical note

Keywords

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Cite this